Short Course Scanning Probe Microscopy: Principles and Practices
University of Surrey, 12-16 Jan. 2009
Asylum Research will be conducting two equipment demonstrations at the University of Surrey SPM Short Course:
January 14, 3.30-5pm – Dual AC™ Mode
January 15, 2.45-5.45pm – High voltage piezoresponse force microscopy
If you are interested in attending these demonstrations, please contact:
Glen Moulton, EngD & MSc Short Course Officer
Tel +44 (0)1483 689076
Additional information can be found on the Short Course website.
The Course
The course will be in two parts: the first two days will be for beginners and those wishing to know the underlying theory of the techniques that they are using. The remaining three days will be for more expert users who wish to examine the state of the art or explore the use of the instruments over a wider range of disciplines. Delegates are welcome to attend either or both parts as appropriate.
The aim of this intensive two-part course is to introduce the principles and practice of Scanning Tunnelling Microscopy (STM), Scanning Force Microscopy (SFM) and other methods of Scanning Probe Microscopy (SPM). The physical concepts employed in the instrumentation of STM and SFM are simple, but the interpretation of the STM and SFM results can be complicated because of the convolution of several interactions in the measurement process. This complication exists in the large-scale imaging of surface morphology as well as in the molecular- and atomic-scale images. Thus, many STM and SFM studies can be misinterpreted. To help to alleviate this problem, we felt it necessary to bring together in this course the essential components of STM and SFM studies, namely the practical aspects of STM and SFM, the image simulation and the qualitative evaluations of tip force induced surface corrugations.
The primary goal of this course will be to describe how the surfaces of various materials are characterised by employing different methods of SPM and what physical/chemical features can be deduced from their images.
This will be achieved through a balance of lectures, tutorials and laboratory demonstrations. The course will offer high quality instruction in a laboratory environment. Lectures given by SPM experts will be supported by demonstrations in which typical experimental problems in SPM will be discussed. The School has four STM and SFM microscopes and much of the subject matter will be demonstrated on these instruments, however we also plan, as in previous years, to offer manufacturers the opportunity to demonstrate state-of-the-art equipment.
The Course will cover the basics of operation and advanced operation. Course registrants will have access to four STM and SFM microscopes in the Surface and Interface Reactions Group and much of the subject matter will be demonstrated on these instruments.
Who Should Attend
The course will be of maximum benefit to you if you are, or expect to be, involved in using any form of Scanning Probe Microscopy as a research, diagnostic or troubleshooting tool. Engineers, Chemists and Physicists who are using Scanning Electron Microscopy and Transmission Electron Microscopy will also find the course extremely useful. |
